Optical and Polarimetry Consultant: Surface and Thin Film Characterization; Optical Instruments

Expertise

• Polarimetry techniques to study surfaces and periodic structures.
• Polarimetry technology applied to lithography and photonic structures.
• Mueller polarimetry and Mueller matrices optics and advanced developments.
• Metrology technology, metrology study groups and metrology equipment suppliers.
• Optical and polarization characterization of nanomaterials.
• Optic instrumentation applied to thin films deposition technologies including epitaxial deposited thin films.
• Optics thin films Instrumentation: spectroellipsometry (SE), Infrared (IRSE) and Ultra Violet Ellipsometry (VUVSE).
• Thin films semiconductor new materials
• Continuous Instrumental development of characterization developing simulation software.
• Educator of current developments in optical in thin films and physical properties of nanotechnology materials.
• Research and development in optical characterization.

Experience

Undisclosed Laboratory, France, Research Project Leader and Consultant, Present

Undisclosed Company, France, 2000 - Present

• Senior Expert: Research and development in optical characterization.
• Project Leader: VUV Ellipsometry Mueller Matrix Polarimetry Scatterometry, Mueller Polarimetry.

CNET, CNS Meylan, France Telecom, Research and Development, 1980 - 1999

• Thin films optical characterization instruments: ellipsometry, visible and infra red and reflectometry.
• Laser induced temperature and ionic implantation.

Independent Consultant

• For various Metrology groups: Horiba Scientific, SOPRA-Lab , KLA Tencor.
• First spectroellipsometry (SE), developments in the visible and infra red range with SOPRA inc.

IBM, T. J. Watson Research Center, Yorktown Height, NY, 1978 - 1979

• Postdoctoral - 2-D paramagnet LB materials.

Commissariat Energie Atomique, (CEA) France, 1975 - 1978

• Center for Nuclear Studies in Grenoble: Thesis; Magnetism Nuclear relaxation OverHauser effect.

Univercidad Nacional de Ingenieria (U l ) Casilla, Lima, Peru, Physics Department, 1974 - 1975

• Educator for the National University of Engineering, Student Thesis Director.

CEA, France, Department of Fundamental Research, 1970 - 1974

• Magnetic Resonance laboratory, research work in solid state, 1971 - 1974
• CEA, Laboratory University, Analytical Chemistry Mass Spectrometry, 1970

Honors & Publications

Academic and Professional Affiliations

• OSA member referee, (Optical Society of America) European Journal of Applied Physics, Thin Solid Films (TSF).
• Thesis referee and reports, University Paris and at Ecole Polytechnique, Paris.

Publications

• 54 peer review publications.
• 4 U.S. Patents.

Education

• Ph.D. Postdoctoral, Solid State Physics, Grenoble University, France
• M.S. Physics , Grenoble University, France