X-Ray Diffraction Analyst and Expert Witness in Counterfeit Pharmaceuticals, Determination of Polymorph Types, Structural and Failure Analysis, Metal Processing Methods

Technical Consultant #925

X-ray diffraction analysis for characterization of inorganic and organic materials.
Development of X-ray diffraction techniques and equipment.
Patent law, expert witness and technology related to X-ray diffraction, counterfeit pharmaceuticals, determination of polymorph types and failure analysis.
Materials synthesis for ceramics and metals.
Determination of polymorph types in pharmaceuticals.
Development of methods for detecting counterfeit pharmaceuticals.
Polymorph stability testing.
Solid background in characterization techniques.
Structural and failure analysis of materials deformed by fatigue and stress corrosion cracking.
Metal processing methods and semiconductor characterization.
26 years' experience in teaching X-ray analysis methods.

Undisclosed Company, Chairman, Scientific Advisory Board, 2004 - Present

Co-founder of company designing and developing material authentication and detection solutions with technology that combines forensic analysis and penetrating power of X-rays, allowing rapidly verification of materials inside their original sealed package.
Design and prove concept for noninvasive testing for counterfeit pharmaceuticals.
Develop key technology elements based on patented technology.
Explore new markets and applications.

Undisclosed Company, Chief Scientist, 1997 - Present

Co-founder of company and full responsibility for technical function.
Analytical services including full-service X-ray diffraction, electron microscopy studies, quantitative and qualitative analysis and litigation support and services as expert witness.
Develop new analytical techniques.
Develop new markets and interface with clients.
Principal investigator for corporate and government research programs.
Expert witness, patent reviews, laboratory testing and report generation.
Wide range of materials studied - pharmaceuticals, ceramics, semiconductors, polymers, metals, composites, etc.
Preparation of proposals.

Rutgers University, NJ, Professor, 1978 - Present

Emeritus status starting in 2009.
Full Professor from 1994 - 2009.
Conducted $22 million in research and development projects as principal investigator.
Responsible for running centralized X-ray facility.
Taught X-ray courses at the graduate and undergraduate level.
Responsible for training of post-doctoral students in advanced X-ray techniques.
Responsible for proposal generation and supervision of Research and Development personnel.

TRW, OK, Metallurgical Engineer, 1976 - 1978

Olin Metals Research, CT, Metallurgist, 1972 - 1976

Harry Diamond Labs (Army Material Command), DC, Physics, 1970 - 1972

Academic and Professional Affiliations

Professor Emeritus, Rutgers University
International Centre for Diffraction Data
American Ceramic Society
ASTM, Association, Materials Research Society, TMS, AIP
American Crystallographic
Member, Sigma Xi Honorary Society
Thesis Advisor, Rutgers University
Course Instructor at Rutgers University (7 undergraduate & 11 graduate courses)
Visiting Lecturer, Shanghai Technical College
ICDD Education Subcommittee
ICDD Metals Subcommittee
Professor Emeritus, Rutgers University
International Centre for Diffraction Data
TMS (NJ Chapter) Program Committee
TMS (NJ Chapter) Student Affairs Committee
Referee for a number of Journals (Applied Physics Letters, Corrosion, Journal of Applied Physics, Journal of Applied Crystallography, Journal of Materials Research, Journal of Electronic Materials, Metallurgical Transactions, Materials Science & Engineering, Nanostructured Materials, Powder Diffraction, Scripta Materialia, Trans of ASME)
Proposal Reviewer (National Science Foundation, Department of Energy, State of Connecticut, Associate Director of Advanced Coating Technology Program, Rutgers (ONR funded)
Rutgers Surface Modification Research Center, Co-Chair Steering Committee

Credentials

Publications